Scanning electron microscope

Results: 580



#Item
261Microsoft Word - RohrerMedal-Result-PressRelease201406(English).docx

Microsoft Word - RohrerMedal-Result-PressRelease201406(English).docx

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Source URL: www.sssj.org

Language: English - Date: 2014-06-30 03:05:20
262Microsoft Word - RohrerMedal-Result-PressRelease201406(English).docx

Microsoft Word - RohrerMedal-Result-PressRelease201406(English).docx

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Source URL: www.zurich.ibm.com

Language: English - Date: 2014-06-30 02:25:19
263Program Highlights from ESEM 2014 Marco Torchiano, Tore Dybå The ESEM Symposium is an international venue for researchers and practitioners interested in measurement and empirical evidence in software engineering.

Program Highlights from ESEM 2014 Marco Torchiano, Tore Dybå The ESEM Symposium is an international venue for researchers and practitioners interested in measurement and empirical evidence in software engineering.

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Source URL: www.computer.org

Language: English - Date: 2015-01-23 15:02:57
264PHiTEM Platform for High Temperature Materials Scope of project With the establishing of the platform of high temperature materials and multi-scale characterisation of micro-structure and mechanical behaviour of these ma

PHiTEM Platform for High Temperature Materials Scope of project With the establishing of the platform of high temperature materials and multi-scale characterisation of micro-structure and mechanical behaviour of these ma

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Source URL: www.ccem.ch

Language: English - Date: 2014-03-17 10:46:22
265Microsoft PowerPoint - SigGen-Optimal-Imaging11Sep05_ESB2005-Geoff.ppt

Microsoft PowerPoint - SigGen-Optimal-Imaging11Sep05_ESB2005-Geoff.ppt

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Source URL: www.ecmjournal.org

Language: English - Date: 2012-06-13 09:22:32
266Microsoft PowerPoint - Limitations-Potential-SEM-Iolo_printout.ppt

Microsoft PowerPoint - Limitations-Potential-SEM-Iolo_printout.ppt

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Source URL: www.ecmjournal.org

Language: English - Date: 2012-06-13 09:22:31
267SLS _Symposia_Abstract_Vila-Comamala

SLS _Symposia_Abstract_Vila-Comamala

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Source URL: www.psi.ch

Language: English - Date: 2015-02-03 08:50:49
268SLS Symposium on Imaging Tuesday, July 8, [removed]:00 to 12:15, WBGB[removed]:00 Electronically active dopant profiling of power semiconductor structures by complementary Scanning Probe Microscopy (SPM)

SLS Symposium on Imaging Tuesday, July 8, [removed]:00 to 12:15, WBGB[removed]:00 Electronically active dopant profiling of power semiconductor structures by complementary Scanning Probe Microscopy (SPM)

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Source URL: www.psi.ch

Language: English - Date: 2015-02-03 08:51:12
269Euro-BioImaging European Research Infrastructure for Imaging Technologies in Biological and Biomedical Sciences WP7 Access to Innovative Technologies-ALM

Euro-BioImaging European Research Infrastructure for Imaging Technologies in Biological and Biomedical Sciences WP7 Access to Innovative Technologies-ALM

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Source URL: www.eurobioimaging.eu

Language: English - Date: 2014-07-03 10:30:44
270Physics / Microscope / Electron microscope / Optical microscope / Scanning electron microscope / Nanotechnology / Electron / Transmission electron microscopy / Scanning transmission electron microscopy / Scientific method / Electron microscopy / Science

Process: Scanning Electron Microscope (SEM) Introduction: Scanning Electron Microscopes or SEM’s are high powered microscopes that use a beam of electrons to take pictures at magnifications and resolutions fa

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Source URL: www.uwstout.edu

Language: English - Date: 2011-10-28 14:40:20